Design-for-test for Digital IC's and Embedded Core Systems
"Design-for-Test for Digital IC's and Embedded Core Systems is filled with full-page graphics taken directly from the author's teaching materials. Every section is illustrated with flow-charts, engineering diagrams, and conceptual summaries to make learning and reference fast and easy. This book is a must for the engineers and managers involved in design and testing."--BOOK JACKET.
- ISBN 13 : 9780130848277
- ISBN 10 : 0130848271
- Judul : Design-for-test for Digital IC's and Embedded Core Systems
- Pengarang : Alfred L. Crouch,
- Kategori : Computers
- Penerbit : The Rosen Publishing Group
- Bahasa : en
- Tahun : 1999
- Halaman : 349
- Halaman : 349
- Google Book : http://books.google.co.id/books?id=vZeKnQAACAAJ&dq=intitle:embedded+test&hl=&source=gbs_api
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